Accession Number : AD0862469

Title :   SSB5371 Qualification, P/N X1570659 Revision B.

Descriptive Note : Final rept.,

Corporate Author : NAVAL WEAPONS CENTER CHINA LAKE CA

Personal Author(s) : Bryan, Lucile

Report Date : 22 JAN 1969

Pagination or Media Count : 93

Abstract : The report describes qualification tests performed on silicon semiconductors used on Shrike missiles.

Descriptors :   (*TRANSISTORS, RELIABILITY(ELECTRONICS)), AIR TO SURFACE MISSILES, GUIDED MISSILE COMPONENTS, ENVIRONMENTAL TESTS, THERMAL SHOCK, SOLDERED JOINTS, ELECTRICAL PROPERTIES.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE