Accession Number : AD0863222

Title :   LSI Correlator.

Descriptive Note : Quarterly rept. no. 2, 1 Sep-30 Nov 69.

Corporate Author : TRW SYSTEMS GROUP REDONDO BEACH CA

Report Date : 30 NOV 1969

Pagination or Media Count : 66

Abstract : An integrated circuit test pattern was designed to demonstrate the integrability and performance of one correlator bit, associated clock drivers, voltage reference sources, and numerous test devices. Two circuit versions of a correlator bit were designed and analyzed, one with Schottky barrier diode clamps and one without. Schottky barrier diodes were fabricated using aluminum, titanium-aluminum, moly-gold, and chromium-silicon monoxide. The latter showed highest yield and best electrical characteristics. Shallow junction transistor devices were fabricated to prepare for the correlator test pattern fabrication phase. Computer analysis results were obtained on the SBD and DCC correlators. (Author)

Descriptors :   *INTEGRATED CIRCUITS), (*CORRELATORS, SEMICONDUCTOR DIODES, LOGIC CIRCUITS, TRANSISTORS, SHIFT REGISTERS, MANUFACTURING, TEST METHODS.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE