Accession Number : AD0863238
Title : An X-Ray Diffraction Study of Chromium-Gold Thin Films.
Descriptive Note : Final rept.,
Corporate Author : NAVAL AIR DEVELOPMENT CENTER WARMINSTER PA AERO-ELECTRONIC TECHNOLOGY DEPT
Personal Author(s) : Lutz, David A.
Report Date : 23 DEC 1969
Pagination or Media Count : 20
Abstract : The chromium-gold thin films system was studied using direct recording X-ray diffraction. Chromium and/or gold thin films were deposited, in vacuum onto glass substrates at ambient and elevated temperatures. Those thin films deposited at ambient temperatures were later annealed. The resultant X-ray diffraction patterns were basically that of gold. The positions and relative intensities of the X-ray diffraction maxima varied with sample. This variation seemed to be a function of sample composition, deposition conditions, and post deposition treatment. (Author)
Descriptors : (*METAL FILMS, X RAY DIFFRACTION), (*ELECTRIC CONNECTORS, METAL FILMS), CHROMIUM, GOLD, VAPOR PLATING, VACUUM APPARATUS, SUBSTRATES, GLASS, RELIABILITY(ELECTRONICS), CRYSTAL STRUCTURE.
Subject Categories : Electrical and Electronic Equipment
Metallurgy and Metallography
Distribution Statement : APPROVED FOR PUBLIC RELEASE