Accession Number : AD0863238

Title :   An X-Ray Diffraction Study of Chromium-Gold Thin Films.

Descriptive Note : Final rept.,

Corporate Author : NAVAL AIR DEVELOPMENT CENTER WARMINSTER PA AERO-ELECTRONIC TECHNOLOGY DEPT

Personal Author(s) : Lutz, David A.

Report Date : 23 DEC 1969

Pagination or Media Count : 20

Abstract : The chromium-gold thin films system was studied using direct recording X-ray diffraction. Chromium and/or gold thin films were deposited, in vacuum onto glass substrates at ambient and elevated temperatures. Those thin films deposited at ambient temperatures were later annealed. The resultant X-ray diffraction patterns were basically that of gold. The positions and relative intensities of the X-ray diffraction maxima varied with sample. This variation seemed to be a function of sample composition, deposition conditions, and post deposition treatment. (Author)

Descriptors :   (*METAL FILMS, X RAY DIFFRACTION), (*ELECTRIC CONNECTORS, METAL FILMS), CHROMIUM, GOLD, VAPOR PLATING, VACUUM APPARATUS, SUBSTRATES, GLASS, RELIABILITY(ELECTRONICS), CRYSTAL STRUCTURE.

Subject Categories : Electrical and Electronic Equipment
      Metallurgy and Metallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE