Accession Number : AD0865810
Title : LSI Correlator.
Descriptive Note : Quarterly rept. no. 3, 1 Dec 69-28 Feb 70.
Corporate Author : TRW SYSTEMS GROUP REDONDO BEACH CA
Report Date : 28 FEB 1970
Pagination or Media Count : 22
Abstract : The integrated circuit test pattern, CTP, was fabricated to demonstrate the integrability and performance of one correlator bit, associated clock drivers, voltage reference sources, and numerous test devices. The initial run encountered a p-type contamination in the buried layer antimony source which prevented the Schottky diodes from operating and produced very low f sub T devices. Correcting this problem resulted in good quality Schottky diodes and very high values of f sub T. Testing of these circuits and test devices has begun. The relative yield and high speed performance of four types of correlator bits are being evaluated, with or without Schottky diodes and with thin film or silicon resistors. (Author)
Descriptors : *INTEGRATED CIRCUITS), (*CORRELATORS, SHIFT REGISTERS, SEMICONDUCTOR DIODES, TRANSISTORS, LOGIC CIRCUITS, MANUFACTURING, TEST METHODS.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE