Accession Number : AD0867678

Title :   Preconditioning, Group A and Group B Tests on 1N827A(spl) Glass Reference Element IAW Sperry P. O. 23604.

Corporate Author : NAVAL WEAPONS CENTER CHINA LAKE CA

Report Date : 27 JUN 1967

Pagination or Media Count : 77

Abstract : The report contains qualification tests for diodes semiconductors for use in Shrike missile systems.

Descriptors :   (*SEMICONDUCTOR DIODES, RELIABILITY(ELECTRONICS)), AIR TO SURFACE MISSILES, SILICON, ELECTRICAL PROPERTIES, VISUAL INSPECTION, ENVIRONMENTAL TESTS, SPECIFICATIONS, TOLERANCES(MECHANICS).

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE