Accession Number : AD0869638
Title : Quality Verification Test Report on Semiconductor, Transistor, Field Effect, Silicon, N-Channel, Planar, Metal Can.
Corporate Author : NAVAL WEAPONS CENTER CHINA LAKE CA
Report Date : 29 AUG 1969
Pagination or Media Count : 96
Abstract : The purpose of the test report is to discuss the results of the Quality Verification Tests which were performed on a sample of 128 units to determine their conformance to NAVAIR Drawing Number 2604664. (Author)
Descriptors : (*FIELD EFFECT TRANSISTORS, RELIABILITY(ELECTRONICS)), INERTIAL NAVIGATION, DOPPLER NAVIGATION, INSTRUMENTATION, ACCEPTABILITY, SILICON.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE