Accession Number : AD0869638

Title :   Quality Verification Test Report on Semiconductor, Transistor, Field Effect, Silicon, N-Channel, Planar, Metal Can.

Corporate Author : NAVAL WEAPONS CENTER CHINA LAKE CA

Report Date : 29 AUG 1969

Pagination or Media Count : 96

Abstract : The purpose of the test report is to discuss the results of the Quality Verification Tests which were performed on a sample of 128 units to determine their conformance to NAVAIR Drawing Number 2604664. (Author)

Descriptors :   (*FIELD EFFECT TRANSISTORS, RELIABILITY(ELECTRONICS)), INERTIAL NAVIGATION, DOPPLER NAVIGATION, INSTRUMENTATION, ACCEPTABILITY, SILICON.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE