Accession Number : AD0870725

Title :   Failure Analysis of Minuteman Integrated Circuit Failures.

Descriptive Note : Final technical rept. 1 Oct 68-15 Dec 69,

Corporate Author : AUTONETICS ANAHEIM CA

Personal Author(s) : Scott, C. W. ; Gillette, L. K. ; Higashi, S. T.

Report Date : MAY 1970

Pagination or Media Count : 168

Abstract : The report describes experience in determining the actual reliability of Minuteman integrated circuits. The device constructions and evolution are discussed in terms of the materials, design, testing, and failure analysis of these circuits. System failures are shown to occur because of either improper device designs or inefficient inspections and testing. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), SURFACE TO SURFACE MISSILES, FAILURE(ELECTRONICS).

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE