Accession Number : AD0878235
Title : Reliability Characterization and Prediction of Integrated Circuits.
Descriptive Note : Final technical rept. 20 Sep 68-20 Apr 70,
Corporate Author : BOEING AEROSPACE CO SEATTLE WA
Personal Author(s) : Porter, David C. ; Finke, Warren A.
Report Date : NOV 1970
Pagination or Media Count : 271
Abstract : The objective was the development of analytical techniques for reliability characterization and prediction of integrated circuits for use by USAF project engineers and contractors in reliability design and evaluation of USAF microelectronic equipments. The report includes the results of evaluation of USAF microelectronic equipments. The report includes the results of laboratory tests on 11 different integrated circuits under extremely high stresses of temperature, voltage, current, centrifuge, and temperature shock which disclose different mechanisms of degradation applicable to such devices. These test results are integrated with information gained by survey of the causes of integrated circuit failures and a failure mode and mechanism summary is included. The influences of design, processing, testing, and operative influences are discussed. The relative contributions of the different failure causes are assessed. A six-element reliability characterization and prediction model is developed which includes factors for quality, temperature, mechanical environment, chip complexity, interconnect complexity, and package complexity. (Author)
Descriptors : *RELIABILITY(ELECTRONICS)), (*INTEGRATED CIRCUITS, FAILURE(ELECTRONICS), MICROELECTRONICS, TEST METHODS.
Subject Categories : Electrical and Electronic Equipment
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE