Accession Number : AD0888047
Title : Optical Performance Calculations for Thin Films at 10.6 Microns.
Descriptive Note : Technical rept. 1 Jul 70-1 Jul 71,
Corporate Author : AIR FORCE WEAPONS LAB KIRTLAND AFB NM
Personal Author(s) : Korka, J. E. ; Holmes, D. A.
Report Date : SEP 1971
Pagination or Media Count : 124
Abstract : The Admittance Matrix Method is used to make calculations of the performance of quarter-wave optical multilayer stacks for high reflectances. The performance of various nonabsorbing multilayer stacks is shown and the calculations can be used to estimate the optical performance of low-absorption materials. A study of specific multilayer stacks with low absorption at 10.6 microns has been completed. The effect of variations in thickness of individual layers is shown, and it is concluded that fairly stringent control of thickness must be maintained across the reflector to ensure negligible phase degradation in the reflected wavefront. (Author)
Descriptors : (*OPTICAL COATINGS, REFLECTION), FILMS, SUBSTRATES, LIGHT TRANSMISSION, REFLECTIVITY, REFRACTIVE INDEX, ABSORPTION SPECTRA, INFRARED RADIATION, COMPUTER PROGRAMS.
Subject Categories : Coatings, Colorants and Finishes
Distribution Statement : APPROVED FOR PUBLIC RELEASE