Accession Number : AD0907592
Title : Thin Film Optical Waveguide Technology.
Descriptive Note : Final rept. Jul 71-Jun 72,
Corporate Author : PERKIN-ELMER CORP NORWALK CT
Personal Author(s) : Zernike, Frits
Report Date : SEP 1972
Pagination or Media Count : 77
Abstract : Accurate measurements of the refractive index, the thickness, the propagation velocity and the transmission losses of sputtered glass (Corning 7059) waveguides were made. The results of this program establish a comprehensive characterization of thin film optical waveguides made of glass and useful for applications in integrated optical circuits. (Author)
Descriptors : *WAVEGUIDES), (*FILMS, (*OPTICAL MATERIALS, FILMS), OPTICAL PROPERTIES, MEASUREMENT, INTEGRATED CIRCUITS, ERRORS, OPTICAL GLASS, SPUTTERING, THICKNESS, REFRACTIVE INDEX, LIGHT, PROPAGATION, VELOCITY, WAVE PROPAGATION, ATTENUATION, CRYSTAL GROWTH, SUBSTRATES, SILICON DIOXIDE, TEST EQUIPMENT, ACCURACY, PRISMS(OPTICS).
Subject Categories : Optics
Radiofrequency Wave Propagation
Distribution Statement : APPROVED FOR PUBLIC RELEASE