Accession Number : AD0909446
Title : Application of Time Domain Methods to Integrated Circuit Susceptibility.
Descriptive Note : Rept. for 12 Apr 72-12 Feb 73,
Corporate Author : IKOR INC BURLINGTON MA
Personal Author(s) : Fitzgerald, Derek J.
Report Date : 12 MAR 1973
Pagination or Media Count : 111
Abstract : A unique integrated circuit test fixture developed to measure the susceptibility of Dual-In-Line, Flatpack and TO-99 style packaged devices up to high microwave frequencies is described. Time domain measurement techniques used to determine the reflection and transfer properties of the 741 and 709 operational amplifiers and the 7400 quadruple 2-input positive nand gate in different package configurations are discussed. Also, details are given of an approximate Fourier analytic technique used to provide spectrum transmission characteristics. In addition, measurements made on linear and digital integrated circuits to determine integrated circuit susceptibility to interference and identify vulnerable device injection points are described. (Author)
Descriptors : *RADIOFREQUENCY INTERFERENCE), (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS), DEGRADATION, VULNERABILITY, MICROWAVE AMPLIFIERS, INTEGRAL TRANSFORMS, TRANSFER FUNCTIONS, DIGITAL SYSTEMS, FREQUENCY, RESPONSE, TEST METHODS, SAMPLING, VOLTAGE.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE