Accession Number : ADA017020

Title :   Measurement of X-ray Cross Sections Relevant to a Scanning Ion Microscope.

Descriptive Note : Final rept.,

Corporate Author : MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY

Personal Author(s) : Martin,F. W.

Report Date : 07 OCT 1975

Pagination or Media Count : 8

Abstract : The following is discussed in this report: Design and construction of a novel soft X-ray spectrometer; Integration of the spectrometer into a concurrently designed and constructed vacuum system and electronic system; Measurement of the 280 eV K X-ray emission cross section for carbon foil bombarded with 1-3 MeV carbon, nitrogen and oxygen ions; Discovery and analysis of satellite lines and solid state effects in the 270-290 eV region of spectra measured during prosecution of the above item.

Descriptors :   *Microscopes, *Field emission, *X ray diffraction, Instrumentation, Particle collisions

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE