Accession Number : ADA017020
Title : Measurement of X-ray Cross Sections Relevant to a Scanning Ion Microscope.
Descriptive Note : Final rept.,
Corporate Author : MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY
Personal Author(s) : Martin,F. W.
Report Date : 07 OCT 1975
Pagination or Media Count : 8
Abstract : The following is discussed in this report: Design and construction of a novel soft X-ray spectrometer; Integration of the spectrometer into a concurrently designed and constructed vacuum system and electronic system; Measurement of the 280 eV K X-ray emission cross section for carbon foil bombarded with 1-3 MeV carbon, nitrogen and oxygen ions; Discovery and analysis of satellite lines and solid state effects in the 270-290 eV region of spectra measured during prosecution of the above item.
Descriptors : *Microscopes, *Field emission, *X ray diffraction, Instrumentation, Particle collisions
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE