Accession Number : ADA017181

Title :   Detecting Impurity Levels in GaAs using Electroreflectance.

Descriptive Note : Master's thesis,

Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Personal Author(s) : Douglass,Charles A. , III

Report Date : JUN 1975

Pagination or Media Count : 92

Abstract : The monitoring of the implantation process is the topic of this study. Surface barrier electroreflectance (ER) measurements on the fundamental edge of both melt-doped and ion-implanted gallium arsenide (GaAs) at 300K, using the field-effect technique, reveal structure related to impurity energy levels. Comparison of ER curves of epitaxial, as-grown, melt-doped, and ion-implanted GaAs shows the broadening of the lineshape due to the presence of impurities. Silicon, chromium, cadmium, tellurium, zinc, and tin impurities in melt-doped GaAs and tellurium, sulfur, cadmium, and zinc impurities in ion-implanted GaAs are related to structure in the ER spectrum. The effect of varying modulated voltage, DC bias, impurity concentration, and annealing on the ER spectrum of GaAs is reported.

Descriptors :   *Gallium arsenides, *Ion implantation, *Monitoring, Chemical analysis, Impurities, Semiconductor doping, Band theory of solids, Electric fields, Nondestructive testing, Silicon, Chromium, Cadmium, Tellurium, Zinc, Tin, Theses

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE