Accession Number : ADA018355

Title :   Studies in Chemical Ionization Mass Spectrometry.

Descriptive Note : Final rept. Jan 73-Jun 74,


Personal Author(s) : Futrell,Jean H.

Report Date : MAR 1975

Pagination or Media Count : 280

Abstract : These research efforts have involved studies in chemical ionization mass spectrometry which have led to improved instrumentation, techniques and methodology for trace analysis. Much of the work has emphasized instrumental developments. These have included the development of high pressure ion sources for chemical ionization studies with a high resolution mass spectrometer, the development of super pressure (20 torr) ion sources for exploring maximum sensitivity of chemical ionization mass spectrometry, and, most recently, the development of combined gas chromatography-electron impact-chemical ionization mass spectrometry using a dual source, dual-beam mass spectrometer. This report describes some applications of the latter instrument plus the computer software developed for accumulation of data and data reduction. (Author)

Descriptors :   *Mass spectrometry, *Gas chromatography, *Ionization, *Computer programs, Tracer studies, Electron beams, Chemical analysis, Data acquisition, Data reduction, Data processing, Chemical reactions, Materials

Subject Categories : Computer Programming and Software
      Atomic and Molecular Physics and Spectroscopy

Distribution Statement : APPROVED FOR PUBLIC RELEASE