Accession Number : ADA018633

Title :   Fault Analysis in Electronic Circuits and Systems.

Descriptive Note : Interim rept.,

Corporate Author : TEXAS TECH UNIV LUBBOCK DEPT OF ELECTRICAL ENGINEERING

Personal Author(s) : Saeks,R. ; Liberty,S. R. ; Ransom,M. N. ; Sangani,S. ; Tung,L.

Report Date : NOV 1975

Pagination or Media Count : 200

Abstract : Several Studies resulting from a research program directed at the development of mathematical foundations for fault analysis in electronic circuits and systems are reported. Specific topics covered include fault analysis by functional methods, fault analysis in linear and affine sequential circuits, and fault prediction.

Descriptors :   *Failure(Electronics), Circuits, Electrical equipment, Linear systems, Detection, Isolation, Functional analysis, Matrices(Mathematics), Mathematical prediction

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE