Accession Number : ADA018787

Title :   SIMS Interferometer Study.

Descriptive Note : Final rept. 1 Feb 74-30 Jun 75,


Personal Author(s) : Esplin,Roy W. ; Baker,Doran J. ; Huppi,Ronald J.

Report Date : 31 JUL 1975

Pagination or Media Count : 39

Abstract : The operation and potential uses of a new type of infrared interference spectrometer were studied. The spectrometer selectively modulates one wavelength at a time. The spectrometer forms interference fringes from two laterally displaced images of the source. These interference fringes are the Fourier transform of the source spectrum. The inverse Fourier transform can be accomplished (the source spectrum recovered) by vibrating a grill across the fringes as the amount of lateral displacement of the source images is varied. Since one spectral element is recovered for each amount of lateral image displacement, the spectrometer is called a selective modulation interference spectrometer (SIMS). The spectrometer can also be used as a spectrally tuneable radiometer by setting the amount of lateral displacement to recover the desired wavelength. The SIMS can be designed to have a large throughput without sacrificing resolution. This characteristic is the most important advantage of the SIMS over other spectrometers.

Descriptors :   *Infrared spectrometers, *Interferometers, *Monochromators, Modulation, Selection, Fourier transformation, Interferometry, Real time, Resolution, Noise

Subject Categories : Infrared Detection and Detectors

Distribution Statement : APPROVED FOR PUBLIC RELEASE