Accession Number : ADA019497

Title :   Characterization of Thin Film ZnSe Coatings Using IR Ellipsometry.

Descriptive Note : Master's thesis,

Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Personal Author(s) : Franklin,Arnold L. , Jr

Report Date : DEC 1975

Pagination or Media Count : 59

Abstract : Using a Gaertner L118GT ellipsometer as the basic instrument, an infrared ellipsometer was constructed. The polarizer and analyzer were commercial wire grid elements and the wave plate was made of AR coated cadmium sulfide. A CO2 laser was used as the light source. Five ZnSe films (deposited on glass substrates) were measured at angles of incidence of 45, 50, 60, 65, and 70 degrees. A Fortran IV computer program was used to calculate the refractive index and thickness of each film. The refractive index and thickness appeared to be a function of the angle of incidence, but the variation is believed to be caused by alignment of the quarter-wave plate. No conclusions can be drawn on the change in refractive index with film thickness since the results lack consistency.

Descriptors :   *Laser materials, *Zinc selenides, *Infrared optical materials, *Infrared windows, Ellipsometers, Thin films, Thickness, Refractive index, Polarimetry, Gallium arsenides, Potassium chloride, Substrates, Infrared lasers, Computer applications, Instrumentation, Carbon dioxide lasers, Theses

Subject Categories : Lasers and Masers
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE