Accession Number : ADA117594

Title :   Automatic Test Methods for Linear Microcircuits.

Descriptive Note : Final technical rept. Jul 80-Jun 81,

Corporate Author : MARTIN MARIETTA AEROSPACE ORLANDO FL

Personal Author(s) : Broderick,Steve ; Siepmann,Hans

PDF Url : ADA117594

Report Date : May 1982

Pagination or Media Count : 49

Abstract : The objective of this effort was to review MIL-M-38510 operational amplifier and comparator electrical test conditions, and to develop simplified test procedures of these parts on general purpose automatic test equipment. There was an emphasis on gain measurements. However, all parameters were investigated for implementation on ATE as well as the effects of accuracy, repeatability, and chip heating. Modifications to MIL-M-38510 slash sheets are recommended, as well as additions to same. (Author)

Descriptors :   *Microcircuits, Linear arrays, Test methods, Automatic gain control, Chips(Electronics), Amplifiers, Specifications, Accuracy, Reliability(Electronics)

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE