Accession Number : ADA118040
Title : An Automated Temperature Controller for the Advanced Hall Effect Experimental Data Acquisition System.
Descriptive Note : Master's thesis,
Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING
Personal Author(s) : Page,Daniel John
PDF Url : ADA118040
Report Date : Mar 1982
Pagination or Media Count : 209
Abstract : The purpose of this study was the development of an automated temperature controller to interface with the automated data acquisition system and the experiment. The temperature controller is designed to control the temperature of the silicon sample to within 0.005 degrees kelvin in the temperature range of 4.2 to 300 degrees Kelvin. The control algorithm measures the thermal impulse response of the system and uses this information to adjust and control the temperature. An MC6809 microprocessor with 10K bytes of EPROM and 640 bytes of RAM is used to implement the controller. The control algorithm and other software was developed to enable the controller to control temperature. A number of problems with the present controller design are identified and recommendations for improvements to the design are made.
Descriptors : *Temperature control, *Automatic, *Data acquisition, *Experimental data, *Hall effect, Interfaces, Microprocessors, Silicon, Samplers, Electrical properties, Impurities, Semiconductors, Optical detectors, Integrated circuits, Algorithms, Theses
Subject Categories : Air Condition, Heating, Lighting & Ventilating
Test Facilities, Equipment and Methods
Electricity and Magnetism
Distribution Statement : APPROVED FOR PUBLIC RELEASE