Accession Number : ADA118878
Title : Research on Fault Analysis of Analog Circuits.
Descriptive Note : Final rept. Mar 75-Jun 82,
Corporate Author : MOORE SCHOOL OF ELECTRICAL ENGINEERING PHILADELPHIA PA
Personal Author(s) : Bedrosian,Samuel D
PDF Url : ADA118878
Report Date : Jul 1982
Pagination or Media Count : 24
Abstract : To attack the long standing fault isolation problem in analog electronic circuits, we have focused on two of the major problems. One is the presence of uncertainties such as indeterminancy, vagueness, randomness, and so on that naturally arise during the solution procedure of analog fault isolation. The other is the presence of topological restrictions inherent in specific circuit configurations. Our main attention was focused on dealing with the fault isolation problem involving various kinds of uncertainties such as indeterminancy or vagueness. We show that such problems lend themselves very well to and in fact can be solved by adopting fuzzy set concepts. In particular, this line of research has produced a modified fuzzy set technique applicable to automatic fault isolation. Topological aspects utilizing graph theory may be used effectively to assist in preanalysis of faulty analog electronic circuits. As a spinoff of a consideration of these problems, we developed some new theorems for element value solvability. It should be made clear, however, that effective fault isolation can be accomplished with or without this preanalysis to assist in resolving the more fundamental problem incurred by uncertainty.
Descriptors : *Fault tree analysis, *Analog systems, *Circuit analysis, Faults, Algorithms, Microcomputers, Pattern recognition
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE