Accession Number : ADA119909

Title :   Do Trapped Heavy Ions Cause Soft Upsets on Spacecraft?

Descriptive Note : Final rept.,

Corporate Author : NAVAL RESEARCH LAB WASHINGTON DC

Personal Author(s) : Adams,J H , Jr ; Partridge,K

PDF Url : ADA119909

Report Date : 12 Oct 1982

Pagination or Media Count : 31

Abstract : It has recently been recognized that single intensely-ionizing particles can cause soft upsets in microelectronic components used in spacecraft. These particles can be heavy ions in galactic cosmic rays or heavy ions accelerated in solar flares. When the upsets are due to the trapped radiation, they are thought to result from nuclear interactions initiated by trapped protons. In this report, we have investigated whether there are sufficient numbers of heavy ions trapped in the Van Allen belts to be the dominant cause of soft upsets. We conclude, based on the scanty data available, that the contribution from upsets caused by trapped heavy ions is likely to be important at least under some conditions. We also found that we could not rule out the possibility that trapped heavy ions may cause upset rates that are orders of magnitude larger than those predicted from the trapped proton population. (Author)

Descriptors :   *Heavy ions, *Trapping(Charged Particles), *magnetosphere, *Spacecraft, *Electromagnetic interference, *Microelectronics, Microcircuits, Computer logic, Memory devices, Radiation belts, Van Allen radiation belt

Subject Categories : Atmospheric Physics
      Electrical and Electronic Equipment
      Guided Missiles
      Unmanned Spacecraft

Distribution Statement : APPROVED FOR PUBLIC RELEASE