Accession Number : ADA131532

Title :   Internal Noise of Low-Frequency Preamplifiers.

Descriptive Note : Interim technical rept.,

Corporate Author : UTAH UNIV SALT LAKE CITY DEPT OF PHYSICS

Personal Author(s) : Smith,Steven W

PDF Url : ADA131532

Report Date : 15 Aug 1983

Pagination or Media Count : 15

Abstract : Experimental measurements of low frequency preamplifiers show that a type LM394 bipolar input stage has less internal input noise than the popular PAR-113 commercial amplifier for source resistances under 1000 ohms. A type 2N6483 JFET design shows similar input noise to the PAR-113. The input current noise of the JFET design is insignificant compared with the Nyquist noise of the source resistance. (Author)

Descriptors :   *Preamplifiers, *Low frequency, *Low noise, Noise, Measurement, Noise reduction, Bipolar systems, Input, Bipolar transistors, Junction transistors, Resistance

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE