Accession Number : ADA131844

Title :   The Study of Thin Films on Semi-Insulating Gallium Arsenide by Ellipsometry.

Descriptive Note : Final rept. Jan-Dec 82,

Corporate Author : AIR FORCE WRIGHT AERONAUTICAL LABS WRIGHT-PATTERSON AFB OH

Personal Author(s) : McDevitt,Neil T ; Baun,William L

PDF Url : ADA131844

Report Date : Jun 1983

Pagination or Media Count : 35

Abstract : A computer-grid procedure is discussed where delta and psi values obtained from a thin filmed surface are used to estimate the optical constants of the film-free surface. Thin films can be measured with reasonable accuracy on gallium arsenide; however, the optical constants of these films cannot be obtained. (Author)

Descriptors :   *Ellipsometers, *Thin films, *Gallium arsenides, *Insulation, *Dielectric films, Measurement, Epitaxial growth, Computer applications, Optical properties, Constants, Estimates

Subject Categories : Coatings, Colorants and Finishes
      Test Facilities, Equipment and Methods
      Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE