Accession Number : ADA133491
Title : Analog Fault Diagnosis of Large-Scale Electronic Circuits.
Descriptive Note : Final rept. 1 Jun 78-13 May 82,
Corporate Author : NOTRE DAME UNIV IN DEPT OF ELECTRICAL ENGINEERING
Personal Author(s) : Liu,Ruey-wen
PDF Url : ADA133491
Report Date : 01 Aug 1983
Pagination or Media Count : 166
Abstract : The long-term objective of this research is to develop a practical and reliable Automatic Test Program Generator (ATPG) which will allow us to locate the faulty component(s) of a large analog circuit when it is faulty. The short-term objective is to search for viable and amenable concepts under which long-term objectives can be achieved. During this short period, some significant progress has been made.
Descriptors : *Test methods, *Analog systems, *Faults, *Circuits, Electronics, Feedback, Frequency response, Time domain, Noise, Automation
Subject Categories : Electrical and Electronic Equipment
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE