Accession Number : ADA135664

Title :   EMC (Electromagnetic Compatibility) Modeling and Analysis - A Probabilistic Approach.

Descriptive Note : Phase rept.,

Corporate Author : SYRACUSE UNIV NY DEPT OF ELECTRICAL AND COMPUTER ENGINEERING

Personal Author(s) : Ephreth,A ; Weiner,D D

PDF Url : ADA135664

Report Date : Apr 1983

Pagination or Media Count : 110

Abstract : This report provides a new and fundamental basis for EMC analysis, i.e. a probabilistic approach. The advances in high speed, high density integrated circuit (IC) technology provides the impetus for investigating new concepts in electromagnetic compatibility/electromagnetic interference (EMC/EMI). Performance criteria, acceptable performance, EMI performance curve and performance threshold are concepts related to susceptibility level in a probabilistic manner. In addition, the interaction at different levels (e.g. system, subsystem, equipment, component) are also discussed. Because large portions of systems are being replaced by complex ICs and because the electromagnetic environment and equipment susceptibility are in reality, random in nature, a probabilistic approach enables one to develop a statistical macromodel. In such an approach, detailed circuit models and functions are replaced by statistical models where probability density functions are used to evaluate probabilities and statistical averages associated with various responses at various operational levels. (Author)

Descriptors :   *Electromagnetic compatibility, *Radiofrequency interference, *Probability, *Mathematical models, Integrated circuits, Electromagnetic environments, High velocity, Performance(Engineering), High density, Vulnerability, Statistics, Threshold effects, Mean, Approach, Graphs, Models, Circuits

Subject Categories : Statistics and Probability
      Radiofrequency Wave Propagation

Distribution Statement : APPROVED FOR PUBLIC RELEASE