Accession Number : ADA135705

Title :   Reliability Modeling of Critical Electronic Devices.

Descriptive Note : Final technical rept. Oct 81-Jan 83,

Corporate Author : IIT RESEARCH INST CHICAGO IL

Personal Author(s) : Coit,D W ; Steinkirchner,J J

PDF Url : ADA135705

Report Date : May 1983

Pagination or Media Count : 374

Abstract : This report presents failure rate prediction procedures for magnetrons, vidicons, cathode ray tubes, semiconductor lasers, helium-cadmium lasers, helium-neon lasers, Nd:YAG lasers, electronic filters, solid state relays, time delay relays (electronic hybrid), circuit breakers, I.C. Sockets, thumbwheel switches, electromagnetic meters, fuses, crystals, incandescent lamps, neon glow lamps and surface acoustic wave devices. Collected field failure rate data were utilized to develop and evaluate the procedures. The reliability prediction procedures are presented in a form compatible with MIL-HDBK-217. (Author)

Descriptors :   *Reliability, *Electronic equipment, *Models, *Electronics, Failure, Hybrid systems, Yag lasers, Predictions, Time delay relays, Surface acoustic wave devices, Rates, Semiconductor lasers, Magnetrons, Vidicons, Helium neon lasers, Electromagnetic radiation, Circuit breakers, Glow lamps, Incandescent lamps, Cathode ray tubes, Electric filters, Neodymium lasers, Neon, Lasers, Relays

Subject Categories : Line, Surface and Bulk Acoustic Wave Devices
      Electrooptical and Optoelectronic Devices
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE