Accession Number : ADA136310

Title :   X-Ray Topographic Measurements of Strain Fields.

Descriptive Note : Technical rept.,

Corporate Author : ILLINOIS UNIV AT URBANA DEPT OF METALLURGY AND MINING ENGINEERING

Personal Author(s) : Stock,S R ; Chen,H ; Birnbaum,H K

PDF Url : ADA136310

Report Date : Aug 1983

Pagination or Media Count : 11

Abstract : This report describes a new technique which allows the determination of strain components in solids with a spatial resolution of about 10 micrometers. The method uses x-ray topography and may be applied to specimens which have relatively high dislocation contents. The technique may be used for thin specimens as well as relatively thick ones. (Author)

Descriptors :   *Single crystals, *X ray diffraction, *Strain(Mechanics), Nondestructive testing, Niobium compounds, Pitch(Inclination), Contours, Topography, Defect analysis

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE