Accession Number : ADA137552

Title :   Liu Fault Diagnosis Investigation.

Descriptive Note : Final rept. Jan-Jun 83,


Personal Author(s) : Campbell,K J ; Stamm,P L

PDF Url : ADA137552

Report Date : Nov 1983

Pagination or Media Count : 68

Abstract : This report is an investigation of the fault diagnosis algorithm attributed to Dr. Ruey-wen Liu at the University of Notre Dame. This approach is based on a faulty current concept in which a faulty component is modelled as a nominal component with a parallel fault current source. Since component faults trace a line in a measurement space as the fault current source takes on different values. Measurements take on a sample circuit from a point in the measurement space. The origin of the measurement space is the intersection of the fault lines of the various circuit components and represents the circuit with all components at their nominal values. The Liu fault diagnosis approach is to determine which fault line is closest to the measurement point of the sample circuit. The circuit used to evaluate the Liu approach is an eight-resistor bridged-T dc network. This nonreactive circuit has been chosen to keep the results simple enough to provide insight into the approach.

Descriptors :   *Algorithms, *Fault tolerant computing, *Circuits, *Faults, Diagnosis(General), Direct current, Tolerance, Computer programs, Plotting, Computerized simulation

Subject Categories : Electrical and Electronic Equipment
      Computer Programming and Software

Distribution Statement : APPROVED FOR PUBLIC RELEASE