Accession Number : ADA138013

Title :   Reliability Analysis of Multi-Components Systems.

Descriptive Note : Technical rept.,

Corporate Author : AEROSPACE CORP EL SEGUNDO CA ELECTRONICS RESEARCH LAB

Personal Author(s) : Millea,M F

PDF Url : ADA138013

Report Date : 15 Dec 1983

Pagination or Media Count : 44

Abstract : The reliability of systems consisting of many semiconductor devices is estimated from the results of an accelerated temperature aging test program. This work is an extension of our previous analysis of accelerated aging, in which we assumed that the results from a Student-t analysis can be applied directly to a multi-component amplifier in the classical combinatory manner. In this work we no longer make this assumption but employ a computer simulation to obtain a more efficient estimation of the reliability of an amplifier consisting of many semiconductor devices. (Author)

Descriptors :   *Reliability, *Transistor amplifiers, *Accelerated testing, *Semiconductor devices, *Computerized simulation, Estimates, Gallium arsenides, Amplifiers, Aging(Materials), Power amplifiers, Temperature

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE