Accession Number : ADA140805

Title :   Development of FT-IR Attenuated Total Internal Reflection Dichroism Techniques for Structural Characterization of Polymer Surfaces.

Descriptive Note : Technical rept.,

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE DEPT OF MATERIALS SCIENCE AND ENGINEERING

Personal Author(s) : Sung,C. S. P. ; Hobbs,J. P.

Report Date : 17 APR 1984

Pagination or Media Count : 49

Abstract : We describe our continuing effort to develop FT-IR attenuated total reflection (ATR) dichroism techniques for the characterization of polymer surface structure and molecular orientation. Following theoretical background, we review the two-dimensional and three-dimensional analyses work based on a specially designed internal reflection crystal and a specially built ATR-sample attachment. In the current development section, we describe briefly the intensity correction procedures used in variable angle studies and an attempt to design a hemispheric crystal attachment to eliminate problems encountered with face-cut reflection crystals.

Descriptors :   *Fourier spectroscopy, *Infrared spectroscopy, *Surface analysis, *Dichroism, *Polymers, Reflection, Methodology, Surface properties, Molecular structure, Orientation(Direction), Attenuation, Crystals, Two dimensional, Three dimensional, Hemispheres, Attachment, Intensity, Corrections

Subject Categories : Polymer Chemistry
      Plastics
      Test Facilities, Equipment and Methods
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE