Accession Number : ADA140805
Title : Development of FT-IR Attenuated Total Internal Reflection Dichroism Techniques for Structural Characterization of Polymer Surfaces.
Descriptive Note : Technical rept.,
Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE DEPT OF MATERIALS SCIENCE AND ENGINEERING
Personal Author(s) : Sung,C. S. P. ; Hobbs,J. P.
Report Date : 17 APR 1984
Pagination or Media Count : 49
Abstract : We describe our continuing effort to develop FT-IR attenuated total reflection (ATR) dichroism techniques for the characterization of polymer surface structure and molecular orientation. Following theoretical background, we review the two-dimensional and three-dimensional analyses work based on a specially designed internal reflection crystal and a specially built ATR-sample attachment. In the current development section, we describe briefly the intensity correction procedures used in variable angle studies and an attempt to design a hemispheric crystal attachment to eliminate problems encountered with face-cut reflection crystals.
Descriptors : *Fourier spectroscopy, *Infrared spectroscopy, *Surface analysis, *Dichroism, *Polymers, Reflection, Methodology, Surface properties, Molecular structure, Orientation(Direction), Attenuation, Crystals, Two dimensional, Three dimensional, Hemispheres, Attachment, Intensity, Corrections
Subject Categories : Polymer Chemistry
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE