Accession Number : ADA141050

Title :   Intrinsic Mechanisms of Multi-Layer Ceramic Capacitor Failure.

Descriptive Note : Annual rept. 15 Mar 83-14 Mar 84,

Corporate Author : VIRGINIA POLYTECHNIC INST AND STATE UNIV BLACKSBURG

Personal Author(s) : Burton,L C

PDF Url : ADA141050

Report Date : Apr 1984

Pagination or Media Count : 77

Abstract : The major objective of this research is to obtain an improved understanding of degradation mechanisms of MLC capacitors. This is being approached from several directions: (a) Capacitors (mainly Z5U and X7R types) that are new or in various degrees of degradation (as judged by insulation resistance) have been cross sectioned for SEM and optical examination, and for compositional measurements using energy dispersive x-ray analysis (EDAX), Auger electron spectroscopy (AES), and electron beam microprobe. (b) Electrical measurements on similar devices include current-voltage, current-temperature and impedance-frequency. (c) Thermoelectric measurements have been made on non-electroded X7R chips in order to separate the carrier concentration from the drift mobility, and to observe their change following reduction of the ceramic.

Descriptors :   *Ceramic capacitors, Optical analysis, Failure(Electronics), Auger electrons, Electron probes, Charge carriers, Composition(Property), Thermoelectricity, Electrical measurement, Measurement, Insulation, X rays, Layers, Drift, Electron beams, Spectroscopy, Dispersions, Mobility, Resistance, Capacitors, Degradation, Energy

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE