Accession Number : ADA181051

Title :   The Impact of VHSIC (Very High Speed Integrated Circuit) Technology on Automatic Test Systems.

Descriptive Note : Final rept. 22 Sep 86-30 Apr 87,

Corporate Author : WESTINGHOUSE ELECTRIC CORP HUNT VALLEY MD INTEGRATED LOGISTICS SUPPORT DIV

Personal Author(s) : Henderson,Joseph G

PDF Url : ADA181051

Report Date : 30 Apr 1987

Pagination or Media Count : 156

Abstract : The primary output of this study contract as defined by the sponsoring organization is to determine a generic VHSIC ATS architecture for VHSIC-based Line Replaceable Modules (LRMs). This was accomplished by a systematic evaluation of all known factors impacting architecture considerations. A recommended architecture was formulated by combining VHSIC-based LRM characteristics (technology implementation, performance parameters and imposed standards) with ATS requirements (technology/test methods and test equipment standards). The VHSIC-based LRM survey, conducted as part of the contract workscope, has currently yielded data on a population of 29 LRM's. The survey information has been entered and compiled in the VHSIC ATS Knowledge Base. Querying the Knowledge using selected sort criteria (Appendix E) indicates a wide variety of implementations in both circuit complexity (MSI through VLSI) and processes (bipolar, CMOS, GaAS, etc.) to achieve LRM functions (VHSIC and non-VHSIC).

Descriptors :   *CIRCUITS, *TEST EQUIPMENT, AUTOMATIC, OUTPUT, SURVEYS, TEST METHODS, SORTING, TEST AND EVALUATION, STANDARDS

Subject Categories : Electrical and Electronic Equipment
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE