Accession Number : ADA182191

Title :   Proceedings of the Symposium on Applied Surface Analysis (8th) Held in Dayton, Ohio on 4-6 June 1986.

Descriptive Note : Final rept.,

Corporate Author : DAYTON UNIV OH RESEARCH INST

Personal Author(s) : Grant,John T.

Report Date : MAR 1987

Pagination or Media Count : 120

Abstract : Contents: Deconvolution as a Correction for Photoelectron Inelastic Energy Losses in the Core Level XPS Spectra of Iron Oxides; Applications of Factor Analysis to Electron and Ion Beam Surface Techniques; A High Performance Low-Cost Computer Interface for AES/XPS; Surface Segregation and Oxidation Studies of Al Be Alloys; The Space WIthin a Profile; Modeling the Effect of Ion Mixing and Surface Roughening on Depth Profiles; Chemical and Structural Characteristics of Rubber Compounds by Auger Spectra and Imaging; Electron Yields and Escape Depths from Kapton and Teflon; In Situ Interface Analysis by Ion Backscattering/Channeling Technique Using a Thin Window Cell; Ion Beam Mixing of Pt with Rene N4 Alloy; High Resolution Electron Microscopy of Surfaces and Surface Reactions; Application of Cross sectional Transmission Electron Microscopy in the Characterization of Ion Beam Processed Materials Surfaces; Voltage Contrast XPS-A Novel Scheme for Spatially Resolved XPS Studies; Angle resolved X ray Photoelectron Spectroscopy fo Epitaxially Grown (100) beta-SiC to 1300C; Characterization of Anodic Oxides on 304L Stainless Steel Surfaces; and ASTM Standard Guide for Electron Bean Effects in Auger Electron Spectroscopy.

Descriptors :   *SURFACE ANALYSIS, *AUGER ELECTRON SPECTROSCOPY, ALLOYS, CORES, ELECTRONS, YIELD, DEPTH, ANODIC COATINGS, OXIDES, CHEMICAL PROPERTIES, STRUCTURAL PROPERTIES, PROFILES, BEANS, ENERGY, LOSSES, FACTOR ANALYSIS, ELECTRON MICROSCOPY, HIGH RESOLUTION, ION BEAMS, SURFACES, POLYIMIDE RESINS, POLYMERIC FILMS, OXIDATION, RUBBER, SURFACE REACTIONS, SYMPOSIA, CELLS, THINNESS, WINDOWS, INTERFACES, MIXING, PHOTOELECTRONS, MATERIALS, IRON OXIDES, SPECTRA, SEGREGATION(METALLURGY), TETRAFLUOROETHYLENE RESINS, X RAY PHOTOELECTRON SPECTROSCOPY

Subject Categories : Physical Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE