Accession Number : ADA182436

Title :   EPR (Electron Paramagnetic Resonance) Studies of Defects and Impurities in Boron-Implanted Hg sub 1-x Cd sub x Te.

Descriptive Note : Technical rept.,

Corporate Author : AEROSPACE CORP EL SEGUNDO CA CHEMISTRY AND PHYSICS LAB

Personal Author(s) : Bowman,Robert C , Jr ; Venturini,E L

PDF Url : ADA182436

Report Date : 22 May 1987

Pagination or Media Count : 23

Abstract : Representative high-purity single crystals of Hg(1-x) Cd(x) Te have been examined by electron paramagnetic resonance (EPR) to determine whether they contain Fe+3 impurities or defects. EPR spectra consistent with substitutional Fe+3 impurities were obtained from some CdTe samples, but no paramagnetic centers have been observed in p-type Hg0.7Cd0.3Te. Since boron ion-implanation is commonly used to produce n-p junctions in HgCdTe during the fabrication of infrared sensor devices, paramagnetic damage centers are likely to form but have not been previously demonstrated. We report the observation of free-electron -like EPR signals in heavily 11B+ implanted CdTe and Hg0.7Cd0.3Te. These spectra have similar EPR characteristics to the so-called dangling-bond defects generated in ion-implanted Si and GaP. Although the identities of these defects in HgCdTe remain to be established, the effects of implant conditions and thermal treatments are briefly described. Keywords: Mercury cadmium tellurids, Ion implantation damage, Defects in semiconductors, Electron paramagnetic, Resonance.

Descriptors :   *ELECTRON PARAMAGNETIC RESONANCE, *CADMIUM TELLURIDES, DEFECTS(MATERIALS), ELECTRONS, FREE ELECTRONS, HEAT TREATMENT, IMPLANTATION, DAMAGE, IMPURITIES, INFRARED DETECTORS, INFRARED EQUIPMENT, ION IMPLANTATION, OBSERVATION, PARAMAGNETISM, PURITY, SEMICONDUCTORS, SINGLE CRYSTALS, MERCURY, BORON

Subject Categories : Inorganic Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE