Accession Number : ADA183211

Title :   An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

Descriptive Note : Technical rept.,

Corporate Author : CAMBRIDGE UNIV (ENGLAND) CAVENDISH LAB

Personal Author(s) : Lamb,R N ; Baxter,J ; Grunze,M ; Kong,C W ; Unertl,W N

PDF Url : ADA183211

Report Date : 15 Jul 1987

Pagination or Media Count : 35

Abstract : Films of polyimide ( 8nm) were formed on a polycrystalline silver surface following heating of a vapor deposited layer of 4,4' oxydianiline (ODA) and 1,2,4,5 Benzenetetracarboxylic anhydride 4 (PMDA). The imidization reaction leading to polymer formation was followed in situ with X-ray Photoelectron Spectroscopy. The uncertainties inherent in a quantitative analysis of the composition of the top 8 nm surface layer (corresponding to the sampling depth of the technique) are discussed with respect to thick films of OFA and PMDA adsorbed on a clean copper (111) surface at 200 K. The fully cured polyimide film contains excess ODA-like and PMDA-like constituents as trapped molecules or terminal groups.

Descriptors :   *VAPOR DEPOSITION, *FILMS, *POLYIMIDE RESINS, COPPER, QUANTITATIVE ANALYSIS, LAYERS, SURFACES, THIN FILMS, X RAY PHOTOELECTRON SPECTROSCOPY, POLYMERS, DEPTH, SAMPLING, THICK FILMS, MOLECULES, TRAPPING(CHARGED PARTICLES)

Subject Categories : Organic Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE