Accession Number : ADA183711

Title :   An XPS (X-Ray Photoelectron Spectroscopy) Study of the Composition of Thin Polyimide Films Formed by Vapor Deposition.

Descriptive Note : Technical rept.,

Corporate Author : MAINE UNIV AT ORONO LAB FOR SURFACE SCIENCE AND TECHNOLOGY

Personal Author(s) : Lamb,R N ; Baxter,J ; Grunze,M ; Kong,C W ; Unertl,W N

PDF Url : ADA183711

Report Date : 15 Jul 1987

Pagination or Media Count : 35

Abstract : Films of polymide ( 8nm) were formed on a polycrystalline silver surface following heating of a vapor deposited layer of 4,4' oxydianiline (ODA) and 1,2,4,5 Benzenetetracarboxylic anhydride (PMDA). The imidization reaction leading to polymer formation was followed in situ with X-ray Photoelectron Spectroscopy. The uncertainties inherent in a quantitative analysis of the composition of the top 8 nm surface layer (corresponding to the sampling depth of the technique) are discussed with respect to thick films of ODA and PMDA adsorbed on a clean copper (111) surface at 200 K. The fully cured polymide film contains excess ODA-like and PMDA-like constituents as trapped molecules or terminal groups.

Descriptors :   *POLYIMIDE RESINS, *THIN FILMS, *X RAY PHOTOELECTRON SPECTROSCOPY, *VAPOR DEPOSITION, *POLYMERIC FILMS, COPPER, QUANTITATIVE ANALYSIS, LAYERS, SURFACES, POLYMERS, DEPTH, SAMPLING, THICK FILMS, MOLECULES, TRAPPING(CHARGED PARTICLES), SOLID STATE ELECTRONICS, SILVER, POLYCRYSTALLINE, ANILINES, ANHYDRIDES

Subject Categories : Physical Chemistry
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE