Accession Number : ADA184906

Title :   Electromagnetics and Electrothermal Approach to Evaluate Failures in Microelectronic Devices Caused by Electrostatic Discharges: Stochastical Aspects of the Device Reliability.

Descriptive Note : Final rept. for 1984-1987,

Corporate Author : RIT RESEARCH CORP ROCHESTER NY

Personal Author(s) : Neelakantaswamy, Perambur S

PDF Url : ADA184906

Report Date : Aug 1987

Pagination or Media Count : 364

Abstract : This report summarizes the following research efforts addressed in the project: Interaction of electromagnetic overstresses, such as electrostatic discharge (ESD) with the microelectronic devices, resulting IC damage(s) and methods of preventing the related failures.

Descriptors :   *MICROELECTRONICS, *RELIABILITY(ELECTRONICS), *ELECTRIC DISCHARGES, *ELECTROSTATIC CHARGE, INTEGRATED CIRCUITS, FAILURE, CHIPS(ELECTRONICS), STOCHASTIC PROCESSES, THERMAL PROPERTIES, METAL OXIDE SEMICONDUCTORS, MOSFET SEMICONDUCTORS

Subject Categories : Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE