Accession Number : ADA187615

Title :   Latent Failures and Coverage in Fault-Tolerant Systems. A VLSI CMOS Circuit Design Technique to Aid Test Generation.

Descriptive Note : Technical rept.,

Corporate Author : STANFORD UNIV CA CENTER FOR RELIABLE COMPUTING

Personal Author(s) : Amer, Hassanein H ; McCluskey, Edward J

PDF Url : ADA187615

Report Date : Dec 1986

Pagination or Media Count : 12

Abstract : Contents: Latent Failures and Coverage in Fault-Tolerant Systems; and A VLSI CMOS Circuit Design Technique to Aid Test Generation.

Descriptors :   *CIRCUITS, FAULT TOLERANT COMPUTING

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE