Accession Number : ADA187954

Title :   Trace Analysis by MS/MS on a Double Focussing Mass Spectrometer,

Corporate Author : MATERIALS RESEARCH LABS ASCOT VALE (AUSTRALIA)

Personal Author(s) : Borrett, V T ; Moritz, A G

PDF Url : ADA187954

Report Date : May 1987

Pagination or Media Count : 14

Abstract : Recent advances in mass spectrometry - mass spectrometry (ms/ms) indicate that this techniques has a number of advantages over conventional methods for identification and trace analysis of organic materials (1). The method involves detection of fragment or daughter ions which arise from spontaneous or collisionally activated decomposition of parent ions in a field free region of the spectrometer. The main advantages are the additional information provided in the form of generic relationships between ions in the mass spectrum and the high specificity which can be achieved. In many cases, data obtained by ms/ms is sufficient to differentiate between isomeric structures. Although the ion intensity observed by ms/ms methods is considerably lower than with conventional MS, the reduction in 'chemical noise' is generally sufficient to allow detection of compounds at low levels by direct mixture analysis.

Descriptors :   *DETECTION, *IONS, *MASS SPECTROMETERS, *ORGANIC MATERIALS, *SPECTROMETERS, CHEMICALS, DECOMPOSITION, FOCUSING, INTENSITY, ISOMERS, LOW LEVEL, MASS SPECTRA, MASS SPECTROMETRY, MIXTURES, NOISE, STRUCTURES, TRACER STUDIES, AUSTRALIA

Subject Categories : Test Facilities, Equipment and Methods
      Organic Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE