Accession Number : ADA189143
Title : Joint Services Electronics Program. Appendix.
Descriptive Note : Annual progress rept. 1 Apr 86-31 Mar 87,
Corporate Author : STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS
Personal Author(s) : Bloom, D M ; Byer, R L ; Kino, G S ; Quate, C F ; Shaw, H J
PDF Url : ADA189143
Report Date : 15 Oct 1987
Pagination or Media Count : 213
Abstract : Partial contents: Optical detection of charge modulation in silicon integrated circuits using a laser diode probe; Observation of dislocations in graphite by scanning tunneling microscopy (STM); Atomic resolution imaging of a nonconductor by atomic force microscopy; A real-time confocal scanning optical microscope; Switchable fiber optic using the acousto-optic bragg interaction and using acoustic transducers deposited upon the fiber surface; All-fiber-optic gyroscopes; Deposition of piezoelectric films on single mode fibers and applications to fiber modulators; Optical sensors for range and depth measurements; Images of a lipid bilayer at molecular resolution by STM; Real time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe; Anomalous distance dependence in STM; Monolithic Nd:YAG fiber laser; Optical interactions with solids; Noninvasive sheet charge density probe for integrated silicon devices; Deposition of oriented zinc oxide on an optical fiber; Low loss single crystal sapphire optical fibers; Electrooptic sampling in GaAS integrated circuits; A guided wave monolithic resonator ruby fiber laser; Tunneling microscopy from 300 to 4.2k; Characterization of proton exchanged waveguides in MgO:LiNbO (sub) 3; High speed, High resolution fiber diameter measurement system.
Descriptors : *ACOUSTOOPTICS, *ATOMIC PROPERTIES, *ELECTROACOUSTIC TRANSDUCERS, *ELECTROOPTICS, *FIBER OPTICS, *INTEGRATED SYSTEMS, *MICROSCOPY, *PIEZOELECTRIC MATERIALS, *TUNNELING, *YAG LASERS, ANOMALIES, BIPOLAR TRANSISTORS, BRAGG ANGLE, DEPOSITION, DEPTH, DIGITAL SYSTEMS, DIODES, DISLOCATIONS, FIBERS, FILMS, GALLIUM ARSENIDES, GRAPHITE, IMAGES, INTEGRATED CIRCUITS, INTERACTIONS, JUNCTION TRANSISTORS, LASERS, MEASUREMENT, MODULATORS, MOLECULES, OBSERVATION, OPTICAL DETECTION, OPTICAL DETECTORS, OPTICAL EQUIPMENT, OPTICAL PROPERTIES, PROBES, RANGE(DISTANCE), REAL TIME, RESOLUTION, SAMPLING, SCANNING, SIGNALS, SILICON, SOLIDS, SURFACES, ZINC OXIDES
Subject Categories : Electrical and Electronic Equipment
Electrooptical and Optoelectronic Devices
Acoustooptic and Optoacoustic Devices
Lasers and Masers
Distribution Statement : APPROVED FOR PUBLIC RELEASE