Accession Number : ADA189143

Title :   Joint Services Electronics Program. Appendix.

Descriptive Note : Annual progress rept. 1 Apr 86-31 Mar 87,

Corporate Author : STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS

Personal Author(s) : Bloom, D M ; Byer, R L ; Kino, G S ; Quate, C F ; Shaw, H J

PDF Url : ADA189143

Report Date : 15 Oct 1987

Pagination or Media Count : 213

Abstract : Partial contents: Optical detection of charge modulation in silicon integrated circuits using a laser diode probe; Observation of dislocations in graphite by scanning tunneling microscopy (STM); Atomic resolution imaging of a nonconductor by atomic force microscopy; A real-time confocal scanning optical microscope; Switchable fiber optic using the acousto-optic bragg interaction and using acoustic transducers deposited upon the fiber surface; All-fiber-optic gyroscopes; Deposition of piezoelectric films on single mode fibers and applications to fiber modulators; Optical sensors for range and depth measurements; Images of a lipid bilayer at molecular resolution by STM; Real time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe; Anomalous distance dependence in STM; Monolithic Nd:YAG fiber laser; Optical interactions with solids; Noninvasive sheet charge density probe for integrated silicon devices; Deposition of oriented zinc oxide on an optical fiber; Low loss single crystal sapphire optical fibers; Electrooptic sampling in GaAS integrated circuits; A guided wave monolithic resonator ruby fiber laser; Tunneling microscopy from 300 to 4.2k; Characterization of proton exchanged waveguides in MgO:LiNbO (sub) 3; High speed, High resolution fiber diameter measurement system.

Descriptors :   *ACOUSTOOPTICS, *ATOMIC PROPERTIES, *ELECTROACOUSTIC TRANSDUCERS, *ELECTROOPTICS, *FIBER OPTICS, *INTEGRATED SYSTEMS, *MICROSCOPY, *PIEZOELECTRIC MATERIALS, *TUNNELING, *YAG LASERS, ANOMALIES, BIPOLAR TRANSISTORS, BRAGG ANGLE, DEPOSITION, DEPTH, DIGITAL SYSTEMS, DIODES, DISLOCATIONS, FIBERS, FILMS, GALLIUM ARSENIDES, GRAPHITE, IMAGES, INTEGRATED CIRCUITS, INTERACTIONS, JUNCTION TRANSISTORS, LASERS, MEASUREMENT, MODULATORS, MOLECULES, OBSERVATION, OPTICAL DETECTION, OPTICAL DETECTORS, OPTICAL EQUIPMENT, OPTICAL PROPERTIES, PROBES, RANGE(DISTANCE), REAL TIME, RESOLUTION, SAMPLING, SCANNING, SIGNALS, SILICON, SOLIDS, SURFACES, ZINC OXIDES

Subject Categories : Electrical and Electronic Equipment
      Electrooptical and Optoelectronic Devices
      Acoustooptic and Optoacoustic Devices
      Lasers and Masers
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE