Accession Number : ADA189451
Title : Computer Aided Fast Turnaround Laboratory for Research in VLSI (Very Large Scale Integrated).
Descriptive Note : Final rept. 1 Oct 83-31 May 87,
Corporate Author : STANFORD UNIV CA CENTER FOR INTEGRATED SYSTEMS
Personal Author(s) : Meindl, James D ; Shott, John
PDF Url : ADA189451
Report Date : 31 May 1987
Pagination or Media Count : 211
Abstract : The principal objectives of the computer aided/Automated fast turn-around laboratory (CAFTAL) for VLSI are: application of cutting edge computer science and software systems engineering to fast turn-around fabrication in order to develop more productive and flexible new approaches; fast turn-around fabrication of optimized VLSI systems achieved through synergistic integration of system research and device research in aggressive applications such as superfast computers, and investigation of physical limits on submicron VLSI in order to define and explore the most promising technologies. To make a state-of-the-art integrated circuit process more manufacturable, we must be able to understand both the numerous individual process technologies used to fabricate the complete device as well as the important device, circuit and system limitations in sufficient detail to monitor and control the overall fabrication sequence. Specifically, we must understand the sensitivity of device, circuit and system performance to each important step in the fabrication sequence. Moreover, we should be able to predict the manufacturability of an integrated circuit before we actually manufacture it. The salient objective of this program is to enable accurate simulation and control of computer-integrated manufacturing of ultra large scale integrated (ULSI) systems, including millions of submicron transistors in a single silicon chip, through creative application of computer science and software engineering.
Descriptors : *COMPUTER PROGRAMS, *INTEGRATED CIRCUITS, *MANUFACTURING, *SYSTEMS ENGINEERING, *TRANSISTORS, CHIPS(ELECTRONICS), COMPUTERS, CREATIVITY, CUTTERS, EDGES, FABRICATION, INTEGRATED SYSTEMS, INTEGRATION, LIMITATIONS, PHYSICAL PROPERTIES, REACTION TIME, RESPONSE, SENSITIVITY, SEQUENCES, SILICON, SIMULATION, STATE OF THE ART, SYNERGISM
Subject Categories : Electrical and Electronic Equipment
Computer Programming and Software
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE