Accession Number : ADA189695
Title : Particle Beam Alignment System for Single Event Upset - Van de Graaff Experiments.
Descriptive Note : Final rept.,
Corporate Author : PHYSICAL SCIENCES INC ALEXANDRIA VA
Personal Author(s) : Corson, Michael R ; McKay, Jack A ; McDermott, James H
PDF Url : ADA189695
Report Date : 01 Jun 1987
Pagination or Media Count : 24
Abstract : This report documents the design and operation of the particle beam alignment system developed for single event upset - Van de Graaff experiments. This system is designed to provide a faster and more accurate optical alignment of the pinhole and the device under test. In this alignment system a laser beam is focused on the device under test, and the pinhole is then aligned with the laser beam using an electronic display. In this way the pinhole is aligned over the device under test. The alignment system consists of three main components: 1. A beam expander for the He-Ne laser which was previously used for pinhole alignment, and neutral density filters to attenuate the laser beam when necessary 2. A new flange for the sample chamber incorporating a calibrated x-y translation stage for the pinhole, and a calibrated x-y translation stage carrying a quadrant photodiode 3. An amplifier and display module to display the output of the photodiode.
Descriptors : *ALIGNMENT, *VAN DE GRAAFF GENERATORS, *PARTICLE ACCELERATOR COMPONENTS, DENSITY, DISPLAY SYSTEMS, ELECTRONIC EQUIPMENT, FILTERS, FLANGES, HELIUM NEON LASERS, LASER BEAMS, MODULAR CONSTRUCTION, NEUTRAL, OPTICAL PROPERTIES, OUTPUT, PARTICLE BEAMS, PHOTODIODES
Subject Categories : Particle Accelerators
Distribution Statement : APPROVED FOR PUBLIC RELEASE