Accession Number : ADA190141
Title : Detecting Bridging Faults with Stuck-at Test Sets.
Descriptive Note : Technical rept.,
Corporate Author : STANFORD UNIV CA CENTER FOR RELIABLE COMPUTING
Personal Author(s) : Millman, Steven D ; McCluskey, Edward J
PDF Url : ADA190141
Report Date : Dec 1987
Pagination or Media Count : 36
Abstract : Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of psuedo-exhaustive test sets. Real chips often contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudo-exhaustive test sets are easy to generate and require little, or no, fault simulation. Criteria have been found for identifying bridging faults unlikely to be detected by test sets. Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested. Keywords: Bridging faults, stuck-at faults, pseudo-exhaustive test, fault modeling, fault tolerant computing.
Descriptors : *TEST SETS, *SHORT CIRCUITS, *CIRCUIT TESTERS, CHIPS(ELECTRONICS), COMPUTERS, DETECTION, FAULT TOLERANT COMPUTING, MODELS, SIMULATION, TIME, INTEGRATED CIRCUITS, MULTIPLEXING
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE