Accession Number : ADA190141

Title :   Detecting Bridging Faults with Stuck-at Test Sets.

Descriptive Note : Technical rept.,

Corporate Author : STANFORD UNIV CA CENTER FOR RELIABLE COMPUTING

Personal Author(s) : Millman, Steven D ; McCluskey, Edward J

PDF Url : ADA190141

Report Date : Dec 1987

Pagination or Media Count : 36

Abstract : Simulations run on sample circuits show that extremely high detection of bridging faults is possible using modifications of psuedo-exhaustive test sets. Real chips often contain bridging faults, and this research shows that stuck-at test sets are not sufficient for detecting such faults. The modified pseudo-exhaustive test sets are easy to generate and require little, or no, fault simulation. Criteria have been found for identifying bridging faults unlikely to be detected by test sets. Techniques for increasing the bridging fault coverage of test sets without consuming excessive computer time are suggested. Keywords: Bridging faults, stuck-at faults, pseudo-exhaustive test, fault modeling, fault tolerant computing.

Descriptors :   *TEST SETS, *SHORT CIRCUITS, *CIRCUIT TESTERS, CHIPS(ELECTRONICS), COMPUTERS, DETECTION, FAULT TOLERANT COMPUTING, MODELS, SIMULATION, TIME, INTEGRATED CIRCUITS, MULTIPLEXING

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE