Accession Number : ADA191379
Title : Instrumentation for Ultrafast Electronics.
Descriptive Note : Final rept. 1 Oct 86-30 Sep 87,
Corporate Author : STANFORD UNIV CA EDWARD L GINZTON LAB OF PHYSICS
Personal Author(s) : Bloom, D M
PDF Url : ADA191379
Report Date : 30 Nov 1987
Pagination or Media Count : 122
Abstract : Increasing numbers of III-V compound semiconductor devices and circuits operate in a regime where internal node testing with traditional electronic means proves impossible due to circuit loading and limited time resolution. Electrooptic sampling employs picosecond infrared laser pulses to non-invasively examine internal node voltages with 100 GHz bandwidth. Under this grant, a very low phase noise synthesizer was purchased to provide stable drive to the laser mode-locker, and a microwave synthesizer was purchased to drive the device under test up to 40 GHz. In addition, a computer aided design graphics workstation was purchased to permit the design of novel ultrafast devices. In-house design, fabrication, and detailed diagnostic testing of ultrafast III-V integrated circuits are now all possible at this unique facility.
Descriptors : *CIRCUITS, *ELECTRONICS, *ELECTROOPTICS, *GROUP III COMPOUNDS, *GROUP V COMPOUNDS, *INFRARED LASERS, *INFRARED PULSES, *INTEGRATED CIRCUITS, *SAMPLING, DIAGNOSIS(GENERAL), DRIVES, FREQUENCY SYNTHESIZERS, HIGH RATE, INTERNAL, MICROWAVE EQUIPMENT, NODES, NUMBERS, RESOLUTION, STABILITY, TEST AND EVALUATION, TIME, VOLTAGE
Subject Categories : Electrical and Electronic Equipment
Solid State Physics
Lasers and Masers
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE