Accession Number : ADA194610
Title : Recent Trends in Parts SEU (Single Event Upset) Susceptibility from Heavy Ions.
Descriptive Note : Technical rept.,
Corporate Author : AEROSPACE CORP EL SEGUNDO CA SPACE SCIENCES LAB
Personal Author(s) : Nichols, D K ; Smith, L S ; Price, W E ; Koga, R ; Kolasinski, W A
PDF Url : ADA194610
Report Date : 25 Mar 1988
Pagination or Media Count : 15
Abstract : JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their joint publication in December 1985. This report presented trends in SEU susceptibility for state-of-the-art parts. An ongoing single event upset (SEU) program at JPL and the Aerospace Corporation is continuing in order to assess specific parts performance in interplanetary and satellite environments and to establish trends in SEU response of many parts types. In 1985, Nichols et al (Ref. 1) published a nearly comprehensive listing of SEU test data for 186 parts. This large collection was sufficient to permit generalizations about the parts SEU susceptibility according to their technology, function, and manufacturer. In this report generalizations are extended to newer classes of parts and the statistical base for some of the previous parts classifications is expanded.
Descriptors : *HEAVY IONS, *STATISTICS, CLASSIFICATION, COLLECTION, EXPERIMENTAL DATA, PARTS, STATE OF THE ART
Subject Categories : Inorganic Chemistry
Distribution Statement : APPROVED FOR PUBLIC RELEASE