Accession Number : ADA195267
Title : Heavy Ion and Proton Tests for Subsystem Upset.
Descriptive Note : Final rept.,
Corporate Author : RCA AEROSPACE AND DEFENSE PRINCETON NJ ASTROSPACE DIV
Personal Author(s) : Brucker, G J ; Oey, P ; Patella, J ; Boross, J ; Xapsos, M
PDF Url : ADA195267
Report Date : 21 Mar 1988
Pagination or Media Count : 10
Abstract : This report describes the results of heavy ion and proton tests for upset in a CMOS/SOS subsystem ALU (Arithmetic Logic Unit) which is part of a spacecraft computer. Provided are an iron spectrum with a maximum LET of 83 MeV-cm2/mg at normal incidence. Protons of 180-MeV energy and 10-microsec pulsewidths were obtained at the Brookhaven REF facility. Peak proton dose rates of 7.9E9 rad/s were delivered by micropulses of 1-ns width and with a period of 5 ns. Results showed that the ALU operated without upset during both heavy ion tests. However, functional failure of microprocessor devices occurred during proton irradiations; whereas RAM and MXR (Microprogram Controller and Sequencer) parts were not upset. A single pulse of 119 krads (Si) caused upset of the microprocessor, but multiple pulse doses of 19 to 60 megarads did not upset the RAM and MXR, respectively.
Descriptors : *RADIATION DAMAGE, *LOGIC CIRCUITS, *COMPLEMENTARY METAL OXIDE SEMICONDUCTORS, ARITHMETIC UNITS, COMPUTERS, CONTROL, DOSE RATE, FAILURE, HEAVY IONS, IRON, IRRADIATION, LOGIC DEVICES, MICROPROCESSORS, MICROPROGRAMMING, PEAK VALUES, PROTONS, PULSES, SPACECRAFT COMPONENTS, SPECTRA, TEST AND EVALUATION, PROTONS, ION BOMBARDMENT
Subject Categories : Nuclear Radiation Shield, Protection & Safety
Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE