Accession Number : ADA196553

Title :   Summaries of Papers Presented at the Semiconductor Lasers Topical Meeting Held in Albuquerque, New Mexico on February 10-11, 1987.

Descriptive Note : Final rept. 1 Jan-31 Oct 87,

Corporate Author : OPTICAL SOCIETY OF AMERICA WASHINGTON D C

Personal Author(s) : Quinn, Jarus W.

Report Date : 31 OCT 1987

Pagination or Media Count : 192

Abstract : Semiconductor diode lasers remain the subject of intensive worldwide development efforts with rapid progress being made in many areas of device design and performance. In addition to their use in optical fiber systems, other applications have been meeting treated all aspects of laser design, development and characterization. Laser and optical techniques are increasingly important for diagnostics of a wide variety of materials and processing technologies. Applications range from diagnostics of impurities and other defects in materials, to probes of dry-processing technologies for semiconductor device fabrication, to imaging techniques for patterning and analysis in VLSI manufacture. These techniques are being used both for analytic measurements and as tools to probe new materials and effects. This meeting brought together workers from all of these areas for the exchange of results and of new directions for research. Optical materials are being applied in ever more stressing environmental conditions. The response and durability of optical materials and coatings under the challenges posed by these environments can determine the overall success of many large-scale programs and of whole classes of optical devices. The purpose of this meeting is to bring together researchers with experience in all aspects (materials, design, fabrication, testing and performance) of optics in highly adverse environments for an exchange of results, techniques and discussion of future research directions. (mjm)

Descriptors :   *DIAGNOSIS(GENERAL), *MEASUREMENT, *OPTICAL EQUIPMENT, *SEMICONDUCTOR DEVICES, *SEMICONDUCTOR DIODES, *SEMICONDUCTOR LASERS, ADVERSE CONDITIONS, COATINGS, ENVIRONMENTS, EXCHANGE, FABRICATION, FIBER OPTICS, GLOBAL, IMAGES, IMPURITIES, METHODOLOGY, NEW MEXICO, OPTICAL MATERIALS, OPTICS, ORIENTATION(DIRECTION), PROBES, PROCESSING.

Subject Categories : Lasers and Masers

Distribution Statement : APPROVED FOR PUBLIC RELEASE