Accession Number : ADA288387
Title : Theory and Software for Light Scattering from Multilayer Optical Components with Interfacial Roughness.
Descriptive Note : Final rept. FY92,
Corporate Author : NAVAL AIR WARFARE CENTER WEAPONS DIV CHINA LAKE CA
Personal Author(s) : Elson, J. M.
PDF Url : ADA288387
Report Date : OCT 1992
Pagination or Media Count : 48
Abstract : First-order perturbation theory is applied to calculate the angular distribution of light scattered when a monochromatic plane wave illuminates a multilayer optical component. The light scattering is assumed to be caused by random roughness at each interface of the multilayer component where the root-mean-square (rms) roughness at any interface is assumed to be much less than the incident wavelength. Input parameters include the incident polarization, angle of incidence, wavelength, rms, and correlation length values for each interface, as well as the design of the multilayer stack. The superstrate medium can be any lossless transparent material. The layer of the multilayer stack and substrate media can be transparent or metallic. Output includes scattered power per unit solid angle normalized to the incident power. The scattered field is considered in both reflection- and transmission-scattering hemispheres. Also, the polarization of the scattered field is retained. Correlated and uncorrelated statistical models for the interface roughness are considered; however, partial correlation is discussed. Numerous equations in the theory are related to the FORTRAN code software listing. Instructions are given to use the software for numerical analysis. Four examples are given along with input data files, listing of numerical output, and plots of numerical output.
Descriptors : *COMPUTER PROGRAM DOCUMENTATION, *LIGHT SCATTERING, *PERTURBATION THEORY, *OPTICAL EQUIPMENT COMPONENTS, COMPUTER PROGRAMS, MATHEMATICAL MODELS, INPUT, OUTPUT, ANGLES, IONS, OPTICAL EQUIPMENT, SCATTERING, POLARIZATION, DISTRIBUTION, INTERFACES, LAYERS, PARAMETERS, MATERIALS, NUMERICAL ANALYSIS, THIN FILMS, LIGHT, SURFACE ROUGHNESS, TRANSPARENCE, SUBSTRATES, SOLIDS, TRANSMITTANCE, FORTRAN, CORRELATION, LENGTH, MEDIA, POWER, LOSSES, VALUE, STATISTICAL ANALYSIS, REFLECTANCE, EQUATIONS, COMPUTER FILES, ANGLE OF INCIDENCE, ROUGHNESS, MACHINE CODING, PLOTTING, PLANE WAVES, STACKING, MONOCHROMATIC LIGHT.
Subject Categories : Optics
Distribution Statement : APPROVED FOR PUBLIC RELEASE