Accession Number : ADA289124

Title :   Analytical Electron Microscopy of Nanometer-Sized Particles.

Descriptive Note : Quarterly rept. no. 3. 1 Sep-30 Nov 94,

Corporate Author : MCCRONE ASSOCIATES INC WESTMONT IL

Personal Author(s) : Rice, Stephen B.

PDF Url : ADA289124

Report Date : 19 DEC 1994

Pagination or Media Count : 18

Abstract : During the past quarter, despite lengthy downtime for the JEOL 4000FX, two aspects of our research plan were initiated: microdiffraction and the effects of prolonged beam exposure on the EELS signature of U oxides. While obtaining microdiffraction patterns, it was recognized that high resolution electron microscope images can be obtained on thin sections produced by ultramicrotomy.

Descriptors :   *ELECTRON MICROSCOPY, *PARTICLES, EXPOSURE(GENERAL), SPECTROSCOPY, HIGH RESOLUTION, DIFFRACTION, OXIDES, PLANNING, IMAGES, SIGNATURES, THINNESS, LOSSES, RESEARCH MANAGEMENT, BEAMS(RADIATION), URANIUM, DOWNTIME.

Subject Categories : Inorganic Chemistry
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE