Accession Number : ADA289532

Title :   Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy. (Material Research Society Symposium Proceedings. Volume 332),

Corporate Author : WASHINGTON UNIV SEATTLE

Personal Author(s) : Sarikaya, Mehmet ; Wickramasinghe, H. K. ; Isaacson, Michael

PDF Url : ADA289532

Report Date : 1994

Pagination or Media Count : 610

Abstract : As the capabilities of microscopy techniques to investigate materials at smaller dimensions improve, processing techniques advance in parallel. In fact, materials synthesis with better-controlled spatial variations at a smaller scale has been demonstrated in many areas of materials and biological sciences. The major purpose of this symposium was not only to use microscopy and spectroscopy techniques for imaging, and compositional and chemical analysis of bulk and surface structures, but also to show that these newly emerging techniques are now capable of directly measuring physical and chemical properties of nanostructured biological and synthetic materials at a local scale. The concept of determining nanoscale properties of materials by microscopy and spectroscopy, therefore, can be expected to open up new avenues for science and engineering of materials, as firmly demonstrated by this symposium. Microscopy techniques included those that use photons, x-rays, electrons, and scanning probe techniques at their highest resolutions, all less than 1000 A down to nanometer and molecular levels, and in some cases I A and smaller. Similarly, spectroscopy techniques included local measurements of bonding, electronic, optical, and magnetic properties, again using probes at the nanometer scale. All of the invited presentations, and many of the extraordinary contributed papers, represented the latest applications of the techniques at the highest resolution levels. Highlights among the presentations included the following, optical microscope, traditionally limited by aberration due to light scattering, we witnessed that the near-field scanning optical microscope (NSOM) can now image surfaces (wet or dry) of materials at an order of better resolution.

Descriptors :   *SPECTROSCOPY, *PHYSICAL PROPERTIES, *COMPOSITE MATERIALS, *MICROSCOPY, SCANNING, LIGHT SCATTERING, MEASUREMENT, METHODOLOGY, OPTICAL EQUIPMENT, PROBES, MAGNETIC PROPERTIES, SYMPOSIA, BIOLOGY, SYNTHESIS, CHEMICAL PROPERTIES, MOLECULES, PROCESSING, RESOLUTION, STRUCTURES, HIGH RESOLUTION, MOISTURE CONTENT, SURFACES, ELECTRONS, ENGINEERING, SCALE, IMAGES, LOW LEVEL, PHOTONS, BONDING, OPTICAL SCANNING, DISTORTION, CHEMICAL ANALYSIS, NEAR FIELD, COMPOSITION(PROPERTY), SYNTHETIC MATERIALS.

Subject Categories : Physical Chemistry
      Biology
      Atomic and Molecular Physics and Spectroscopy
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE